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光學(xué)材料的表征

光學(xué)材料的表征

定  價(jià):78 元

        

  • 作者:哈爾濱工業(yè)大學(xué)出版社
  • 出版時(shí)間:2014/1/1
  • ISBN:9787560342795
  • 出 版 社:哈爾濱工業(yè)大學(xué)出版社
  • 中圖法分類:H31 
  • 頁碼:211
  • 紙張:
  • 版次:1
  • 開本:大32開
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Characterization in Optica/ Materia/s provides information for understanding the properties and performance of optical materials under the influence of the various characterization techniques. Surface and interfacial properties are key to the optical response of a material, and their control and modification during materials processing is necessary to achieve desired behavior. Characterization of Optica/ Materia/s focuses on how surface morphology, microstructure, and chemical bonding influence the optical response of a material, and it illuminates methods used to characterize thin films, multilayer structures, and modified surfaces,
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